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Surface collector probes were applied at TEXTOR for the investigation of silicon fluxes in the scrape-off layer during the first silicon-assisted operation of a tokamak. Probe exposures were made in order to measure the evolution of Si fluxes and the influence of silicon on the behaviour of other impurity fluxes like boron, oxygen and metals. Studies were performed under different conditions: heating mode, plasma density and gas filling. Comparative exposures were made before introduction of Si into the machine as well as immediately and long time after the siliconisation. The exposed graphite samples were examined by surface analysis techniques, including Auger electron and Rutherford backscattering spectroscopies, nuclear reaction analysis and ultra-high resolution microscopies.

Additional information

Authors: RUBEL M, Royal Institute of Technology, Stockholm (SE);EMMOTH B, Royal Institute of Technology, Stockholm (SE);ALMQVIST N, Lulea University (SE);WIENHOLD P ET AL., Forschungszentrum Jülich GmbH (KFA) (DE)
Bibliographic Reference: Article: Journal of Nuclear Materials, Vol. 220-222 (1995) pp. 536-540
Record Number: 199510762 / Last updated on: 1995-07-12
Original language: en
Available languages: en