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Abstract

This paper reports the results of scanning tunneling (STM) and atomic force microscopy (AFM) studies of D+ irradiated graphite and graphite-silicon mixtures. The microscopes were used for studying surface topography and for measuring the surface roughness. The substrates were exposed at various temperatures (60 and 700 C) to different doses of deuterium ions in simulators of plasma-surface interactions and in the TEXTOR tokamak. Also nuclear reaction analysis (NRA) and Rutherford backscattering spectroscopy were applied for the qualitative and quantitative determination of surface composition. The initial stages of radiation damage, nanometer-sized bubbles/blisters, were found in plasma eroded sufaces. These structures only appeared in the graphite phase on the multicomponent material. The microroughness of the surfaces was measured. The AFM was also used for probing the thickness of the plasma-modified layers. The results correlate with the presence of deuterium measured by NRA depth-profiling.

Additional information

Authors: ALMQVIST N, Lulea University (SE);FREDRIKSSON S, Lulea University (SE);RUBEL M, Royal Institute of Technology, Stockholm (SE);EMMOTH B, Royal Institute of Technology, Stockholm (SE);WIENHOLD P, Forschungszentrum Jülich GmbH (KFA) (DE);ILYINSKY L, Institute of Electrical Engineering, St. Petersburg (RU)
Bibliographic Reference: Article: Journal of Nuclear Materials, Vol. 220-222 (1995) pp. 917-921
Record Number: 199510774 / Last updated on: 1995-07-12
Category: PUBLICATION
Original language: en
Available languages: en
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