AFM and STM characterization of surfaces exposed to high flux deuterium plasmaFunded under: EAEC-FUSION 12C
This paper reports the results of scanning tunnelling (STM) and atomic force microscopy (AFM) studies of D(+) irradiated graphite and graphite-silicon mixtures. The substrates were exposed at various temperatures (60 and 700 C) to different doses of deuterium ions in simulators of plasma-surface interactions and in the TEXTOR tokamak. In the initial stages of radiation damage, nanometre-sized bubbles/blisters were found in plasma-eroded surfaces. These structures only appeared in the graphite phase on the multicomponent material. The microroughness of the surfaces was measured. The thickness of the plasma-modified layers correlated with the presence of deuterium measured by NRA depth-profiling. Co-deposited layers were found on surfaces facing the tokamak plasma.
Bibliographic Reference: Article: Journal of Nuclear Materials, Vols. 220-222 (1995) pp. 917-921
Record Number: 199510898 / Last updated on: 1995-08-10
Original language: en
Available languages: en