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Abstract

SF sources such as 252Cf, 244Cm and Pu oxides were investigated to verify the feasibility of a fast coincidence method to determine the absolute SF strength of the source. This was found to be possible for point-sized sources of Cf and Cm. However a bulk Pu oxide sample gives rise to the same problems as when a point source is surrounded by a matrix of scattering and absorbing material. In this case it is possible to construct an empirical correction which does not require a previous mass calibration.

Additional information

Authors: BERTOLINI G, JRC Ispra (IT);PROSDOCIMI A, JRC Ispra (IT)
Bibliographic Reference: EUR 13471 EN (1992) 35 pp., FS, free of charge
Availability: Available from Joint Research Centre, Publication Department, I-21020 Ispra (Va.) (IT)
Record Number: 199510995 / Last updated on: 1995-08-18
Category: PUBLICATION
Original language: en
Available languages: en
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