Helium reemission, desorption and microstructure evolution of graphites under helium ion implantation
Helium reemission, trapping, and thermal desorption from highly ordered pyrolytic graphite (HOPG and HPG) of different orientation, polycrystalline graphite (EK98), and titanium doped graphite (RG-Ti-91) have been measured at irradiation temperatures of 300 K and 800 K. The implantation was performed with a 40 keV 4He ion beam. Detailed transmission electron microscopy (TEM) investigation of the microstructure evolution was made on the implanted specimens.
Bibliographic Reference: Article: Journal of Applied Physics, Vol 78 (1995) No. 1, pp. 137-148
Record Number: 199511185 / Last updated on: 1995-10-10
Original language: en
Available languages: en