Bistatic measurement of dielectric properties at EMSL
The copolar specular reflection coefficients of a surface made of an unknown material can be used to determine its dielectric properties. For this a bistatic measurement configuration was set up in the EMSL (European Microwave Signature Laboratory). The accuracy of the result depends mainly on the characteristics of the material under test and the observation angle. Therefore an investigation has been undertaken to find the limits as well as the optimum measurement parameters for this method. First tests using an artificial lossy material will be presented. For comparison, the results using a standard coaxial measurement system will be shown.
Bibliographic Reference: EUR 16298 EN (1995) 16 pp., FS, free of charge
Availability: Available from Joint Research Centre, Public Relations and Publications Unit, I-21020 Ispra (Va.) (IT)
Record Number: 199511279 / Last updated on: 1995-11-23
Original language: en
Available languages: en