An analysis of tracer diffusion profiles under irradiationFunded under: JRC-ADVMAT 2C
The diffusion equation has been solved for a tracer substance which diffuses into the interior of a crystal after being deposited at the surface assuming a position dependent diffusion coefficient such as that encountered in tracer diffusion tests during an irradiation with high energy particles. The diffusion profiles are calculated for a known initial distribution, to determine D(rad), the coefficient of the radiation enhances diffusion. A formalism is developed to determine D(rad) from the tracer distribution in both regions of the crystal: (i) the region close to the surface where D(rad) increases with the distance from the surface; (ii) the bulk region where D(rad) is constant. By applying the developed formalism to published experimental data, it becomes evident that many researchers do not give a self-consistent evaluation of their measurements.
Bibliographic Reference: EUR 15169 EN (1993) 29 pp., FS, free of charge
Availability: Available from Joint Research Centre, Publication Department, I-21020 Ispra (Va.) (IT)
Record Number: 199511410 / Last updated on: 1995-10-31
Original language: en
Available languages: en