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The beneficial effect of adding yttrium by ion implantation on the oxidation behaviour of powder metallurgically (PM) produced chromium at 900 C has been investigated. Comparative studies were made in which yttrium was added as an oxide dispersoid. Two stage oxidation using oxygen isotope tracers was performed and the oxide scales formed were analysed primarily by secondary neutral mass spectroscopy (SNMS). The addition of yttrium was found to change the oxide scale growth processes. Its presence in the oxide scale, possibly as a segregated phase on the oxide grain boundaries, reduces cation diffusion, causing the oxide growth to be dominated by anion transport. This segregation can cause many, if not all, of the reported beneficial reactive element effects. Ion implantation is shown to be a powerful tool in oxidation studies, and thus for advanced material development.

Additional information

Authors: STROOSNIJDER M F, JRC Ispra (IT);SUNDERKÖTTER J D, JRC Ispra (IT);CRISTOBAL M J, JRC Ispra (IT);BAKER M A, JRC Ispra (IT);JENETT H, Institut für Spektrochemie und Angewandte Spectroskopie, Dortmund (DE);ISENBÜGEL K, Fachhochschule Dortmund (DE)
Bibliographic Reference: Paper presented: 9th International Conference on Surface Modification of Metals by Ion Beams, San Sebastian (ES), September 4-8, 1995
Availability: Available from (1) as Paper EN 39280 ORA
Record Number: 199511465 / Last updated on: 1995-11-03
Original language: en
Available languages: en
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