Community Research and Development Information Service - CORDIS


As part of the analysis of new techniques in microelectronics and computing, an innovative test facility for digital intersections is presented in this work. In order to check the compliance of the intersections to the design specifications, a new piece of equipment based on a periphery interface test has been developed. This equipment comprises different intersection modifiers that allow the adaptation of the electrical characteristics of the serial intersections of a PC to other intersections. Furthermore, different measurements can be taken and a range of defined obstructions can be created at the intersections. The large number of intersections leads to an even larger number of test programmes whereby generally each new intersection requires a new test programme. It became therefore necessary to develop a suitable programme (called COM). This work describes COM, a very flexible and user friendly tool, which can react quickly to the specific demands of the users.

Additional information

Authors: NEUMANN J, Physikalisch-Technische Bundesanstalt, Braunschweig (DE)
Bibliographic Reference: Report: PTB-IT-4 DE (1995) 44pp.
Availability: Available from Physikalisch Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig (DE)
ISBN: ISBN 3-89429-938-X
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