Contrast Variation in White-light Speckle Interferometry with application to 3D Profilometry
The interference of a white light speckle pattern, obtained by reflection from a rough surface, with a reference beam was investigated. A theoretical analysis has been developed to derive the expression of the speckle contrast, observed in the image plane of a telescopic system, as a function of all the parameters of the interference device. A numerical evaluation of the contrast dependence on the optical path difference is presented, as well as its experimental verification. On the basis of these results on the speckle contrast properties a method has been developed for 3-dimensional profilometry of relatively large optically rough objects, using real time digital image processing.
Bibliographic Reference: Article : Optics Communications (1995)
Record Number: 199512125 / Last updated on: 1996-01-15
Original language: en
Available languages: en