Characterization and development of surfaces in the 0.1 nm rangeFunded under: FP3-MAT
Bibliographic Reference: Extract: Workshop on surface characterisation and microhardness measurements : Philips Centre of Manufacturing Technology, 17/18 March 1994, Eindhoven : Proceedings (1994) 7 pp.
Availability: Available from the Measurements and Testing Programme Office, European Commission, DG XII, 200 rue de la Loi, B-1049 Bruxelles (BE)
Record Number: 199520004 / Last updated on: 1995-06-15
Original language: en
Available languages: en