Characterization of Supported Catalyst Systems with Surface Spectroscopies
Studies of real and model catalyst systems are reported for which low-energy ion scattering (LEIS) is used in combination with other spectroscopies, such as Rutherford backscattering (RBS), atomic emission spectroscopy (AES), thermal desorption spectroscopy (TDS), X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. The applicability of these techniques to real systems and the relevance of model catalysts is discussed. The results shown demonstrate the usefulness of these spectroscopies for the characterization of supported catalysts, in particular for the analysis of the composition and the arrangement of the topmost atomic layers. Among the examples given are special aspects of catalyst impregnation, the investigation of solid-solid wetting which may be relevant to catalyst preparation and strong metal-support interactions (SMSI effect) in supported Rh metal catalysts.
Bibliographic Reference: Article: Phys. Stat. Sol. (B), Vol. 192 (1995) pp. 465-475
Record Number: 199610491 / Last updated on: 1996-05-20
Original language: en
Available languages: en