Perpendicular, Monostatic Measurement of the Dielectric Constant of a Layer of Unknown Material
The perpendicular reflection coefficient of a layer made of an unknown material can be used to determine its dielectric properties. For this a quasi-monostatic measurement configuration was set up in the European Microwave Signature Laboratory (EMSL). The accuracy of the method depends mainly on the exact value for the thickness of the layer and on the characteristics of the material under test itself. First tests using an artificial lossy material are presented in this publication. For comparison the results using a standard coaxial measurement system are shown.
Bibliographic Reference: EUR 16370 EN (1996) 13pp., FS, free of charge
Availability: Available from the Public Relations and Publications Unit, JRC Ispra, I-21020 Ispra (IT)
Record Number: 199610529 / Last updated on: 1996-05-13
Original language: en
Available languages: en