Method for 3D profile measurement using speckle interference in partially coherent light
We investigated the interference of speckle patterns in partially coherent light with a reference beam. On the basis of the speckle contrast properties we developed a method and an instrument for full field measurement of 3D profile of relatively large rough objects, using real-time image processing.
Bibliographic Reference: Paper presented: 4 Conv. Naz. Strumentazione e metodi di misura elettroottici, Milano (IT), 29-31 May, 1996
Availability: Available from (1) as Paper IT 39800 ORA
Record Number: 199610725 / Last updated on: 1996-09-30
Original language: it
Available languages: it