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Specimens of sintered UO(2), a high melting point ceramic with the fluorite structure, were irradiated with heavy ions ((100)Mo, (116)Sn, (129)Xe, (197)Au, (238)U) with different fluences (5.10{1} to 7.10{13} ions/cm{2}) up to an energy of 11.4 MeV/amu. The influence of a range of electronic stopping powers (dE/dx equals 10 to 60 keV/nm) on the mechanisms of damage formation was studied. Transmission Electron Microscopy was performed to identity and characterize the damage induced by these ions. Latent tracks produced by U ions of 11.4 MeV/amu were observed at a high value of energy loss dE/dx (about 60 keV/nm). The radii of the observed tracks were calculated using a thermal spike model, taking into account the thermodynamic parameters of the material and the energy and velocity of the incoming ions. The TRIM code was used to determine the displacements profile and the energy distribution along the ion paths. Good agreement with the experimental results was found. The dependence of damage formation on the ion dose was also studied. For instance, defect clusters and loops were produced in UO(2) irradiated with (129)Xe of 173 MeV (dE/dx about 29 keV/nm) between 7.10{10} and 7.10{13} ions/cm{2}.

Additional information

Authors: WISS T, JRC Karlsruhe (DE);MATZKE H, JRC Karlsruhe (DE);TRAUTMANN C, Gesellschaft für Schwerionenforschung, Darmstadt-Wixhausen (DE);TOULEMONDE M, Laboratoire mixte CEA-CNRS, Caen (FR);KLAUMÜNZER S, Hahn-Meitner-Institute, Berlin (DE)
Bibliographic Reference: Paper presented: E-MRS Meeting, Strasbourg (FR), June 4-7, 1996
Availability: Available from (1) as Paper EN 40010 ORA
Record Number: 199611048 / Last updated on: 1996-09-30
Original language: en
Available languages: en