Quantitative spectroscopy of X-ray lines and continua in tokamaks
Crystal and synthetic multilayer diffractors, deployed either as flat Bragg reflectors, or curved are used to study the spectrum of COMPASS-D and other tokamaks in the wavelength region 1-100 angstroms. The work concentrates on the measurement of absolute photon fluxes and the derivation of volume emissivities of the lines and continua in the X-ray region. The sensitivities of these instruments to absolute photon flux have been constructed ab initio from the individual component efficiencies. The X-ray continuum intensity has been used as a calibration source to derive absolute instrument sensitivity. In the COMPASS-D tokamak, changes in the effective ion charge state have been derived for different operating conditions. From the irradiances of the line emission, changes in the absolute level of impurities following 'boronization' of the vacuum vessel have also been documented.
Bibliographic Reference: Article: UKAEA FUS 348 EN (1996) 16pp.
Availability: Available from the Librarian, UKAEA, Culham Laboratory, Abingdon, Oxon, OX14 3DB (GB)
Record Number: 199611493 / Last updated on: 1997-01-16
Original language: en
Available languages: en