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In this paper deuterium retention in five types of tungsten samples (W single crystal, W produced by hot pressing, chemical vapor and plasma sprayed deposited W coatings) has been investigated during and after implantation with 1.5 keV D-ions at 300, 600 and 900 K by means of re-emission, thermal desorption spectroscopy and nuclear reaction analysis measurements. Deuterium inventory and its spontaneous and thermal release depend strongly on the structure of the material. At 300 K, the saturated amount of D retained in the sample is in the range 1E17 to 4E17 D/cm{2}. For higher implantation temperature, 900 K, the retained amount is smaller by a factor of about 50 than for 300 K. During implantation D is retained far beyond the implantation zone. An amount of approximately equal to 3E16 D/cm{2} is trapped in the near-surface layer during implantation at 300 K. More than 50% of the implanted D diffuses into the bulk and is captured by lattice imperfections.

Additional information

Authors: ALIMOV V K, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE);SCHERZER B M U, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE)
Bibliographic Reference: Article: Journal of Nuclear Materials, Vol. 240 (1996) No. 1, pp. 75-80
Record Number: 199710367 / Last updated on: 1997-04-23
Original language: en
Available languages: en