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  • The development of a Rx goniometer intended to provide the automatic measurement of polycrystalline materials in grains as a function of the diagrammatic orientation of the crystals

Abstract

Recent techniques regarding electronic microscopic analyses (electron channelling pattern - ECP, EBSP) turn out to be slow and too onerous, even though they may rather precisely give the crystal orientation together with their dimensional evaluation. During the workshop a Tx goniometer prototype was constructed. It allows the study of the kinetics of grain evolution by measuring their dimension according to any of their patterns. Following the initial study on the ideal conditions of calibration and operative arrangement, tests on industrial steels had been performed. Re-crystallization and grain-growing kinetics had been conducted on some of them. The Rx results were then compared with some alternative techniques (etch-pitting, QTM). The relatively simple implement, the fast preparation of samples, the automatic function and the relatively short time acquisition make the technique promising for both routine measurement and analysing re-crystallisation kinetics, grain evolution within material whose patterns (texture) play an important role.

Additional information

Authors: CAMPOPIANO A, Centro sviluppo materiali SpA, Roma (IT);BARTOLI P, Centro sviluppo materiali SpA, Roma (IT);ABBRUZZESE G, Centro sviluppo materiali SpA, Roma (IT)
Bibliographic Reference: EUR 16665 IT (1997) 44pp., FS, ECU 8.50
Availability: Available from the (2)
ISBN: ISBN 92-828-0164-0
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