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Abstract

Oxidation experiments at 800 C and 900 C, partly in atmospheres enriched in isotope tracers, with subsequent Secondary Neutral Mass Spectrometry (SNMS) depth profiling confirmed that two well-known oxidation mechanisms are also valid for the title materials: In powder metallurgical Cr, Y addition shows the reactive element effect, most completely by means of Y implantation and to a lesser extent by the addition of Y(2)O(3) dispersion, classical fast Cr outward transport dominated kinetics is replaced by kinetics that is governed by slow inward diffusion of oxygen. In gamma-TiAl with 2 at-% Cr, N is identified as the frontline oxidizing element being able to penetrate existing oxide and nitride layers inwards towards the bulk metal. These results exemplifying that the combination of plasma SNMS depth profiling with oxidation experiments, especially in (15)N(2)/(18)O(2) tracer atmosphere, and with reactive element implantation is an excellent method to obtain basic insights into corrosion mechanisms. Especially advantageous is the use of SNMS because of its much lesser matrix dependence compared to SIMS which has more frequently been used for this kind of experiments.

Additional information

Authors: JENETT H, Institut für Spektrochemie und Angewandte Spektroscopie, Dortmund (DE);SUNDERKÖTTER J D, JRC Ispra (IT);STROOSNIJDER M F, JRC Ispra (IT)
Bibliographic Reference: Article: Fresenium Journal of Analytical Chemistry (1997)
Record Number: 199711155 / Last updated on: 1997-09-23
Category: PUBLICATION
Original language: en
Available languages: en
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