The work presented in this final report concerns the evaluation of the low energy electrons induced X-ray spectrometry (LEEIXS) for the measurements of both the surface cleanliness and the surface residual elements on steel. The results are compared to those obtained with other surface analytical methods. LEEIXS allows films of intermediate thicknesses to be analysed, compared with the weak depth penetration of electronic spectroscopies and the larger ones of other methods. The experimental conditions have to be optimized for each sample in order to probe the thickness of the film only. The aim of this work was to develop the instrument in different fields of application.
Bibliographic Reference: EUR 16185 FR (1997) 61pp., FS, ECU 11.50
Availability: Available from the (2)
ISBN: ISBN 92-828-1679-6
Record Number: 199711742 / Last updated on: 1998-02-03
Original language: fr
Available languages: fr