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Abstract

The use of Secondary Ion Mass Spectrometry (SIMS) for the characterization of single microparticles as to trace element concentration and isotopic composition is described. Applications of the technique for the characterization of real samples are given. Uranium particles with different abundance of the uranium isotope 235 have been identified and measured. The possibility of handling also hot particles in the laboratories of the Institute for Transuranium Elements (ITU) is illustrated. For example, plutonium particles have been characterized by SIMS, as regards shape and size as well as isotopic ratios. The results found were in agreement with those obtained by scanning electron microscopy for the shape and size and with those from thermal ionization mass spectrometry for isotopic ratios. The capability of SIMS for the detection of trace elements is also highlighted.

Additional information

Authors: BETTI M, JRC Karlsruhe (DE);TAMBORINI V, JRC Karlsruhe (DE);FORCINA T, JRC Karlsruhe (DE);HIERNAUT T, JRC Karlsruhe (DE);KOCH L, JRC Karlsruhe (DE)
Bibliographic Reference: Paper presented: International Symposium on International Safeguards, Vienna (AT), October 13-17, 1997
Availability: Available from (1) as Paper EN 41081 ORA
Record Number: 199810058 / Last updated on: 1998-02-03
Category: PUBLICATION
Original language: en
Available languages: en