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Ce/Fe and Ce/FeCoV multilayers have been grown by magnetron sputtering on Si substrates with layer thicknesses in the range from 10 angstroms to 40 angstroms. The influence of the sputtering conditions and design of the multilayers on the crystallinity of the layers and on the quality of the interfaces has been studied by X-ray diffraction and reflection. The interfaces are well defined and the layers are crystalline down to an individual layer thickness of 20 angstroms. Ce/FeCoV multilayers show sharper interfaces than Ce/Fe ones but some loss of crystallinity is observed. Hysteresis loops obtained by SQUID show different behaviour of the bulk magnetization as a function of the layer thickness. Fe moments are found by Mössbauer spectroscopy to be perpendicular to the interfaces for small periodicity multilayers.

Additional information

Authors: TIXIER S, ETH and Paul-Scherrer-Institut, Laboratory for Neutron Scattering, Villigen (CH);BÖNI P, ETH and Paul-Scherrer-Institut, Laboratory for Neutron Scattering, Villigen (CH);MANNIX D, University of Liverpool (GB);STIRLING W G, University of Liverpool (GB);LANDER G H, JRC Karlsruhe (DE)
Bibliographic Reference: Article: Physica B, Vol. 234-236 (1997), pp. 473-474
Record Number: 199810313 / Last updated on: 1998-03-09
Original language: en
Available languages: en