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Abstract

Cerium/iron and cerium/iron cobalt vanadium multilayers have been grown by magnetron sputtering on silicon substrates with layer thicknesses in the range 10-40 angstroms. The influence of the sputtering conditions and design of the multilayers on the crystallinity of the layers and on the quality of the interfaces has been studied by X-ray diffraction and reflection. The interfaces are well defined and the layers are crystalline down to an individual layer thickness of 20 angstroms. Cerium/iron and cerium/iron cobalt vanadium multilayers show sharper interfaces than cerium/iron ones but some loss of crystallinity is observed. Hysteresis loops obtained by SQUID show different behaviour of the bulk magnetization as a function of the layer thickness. Iron moments are found by Mössbauer spectroscopy to be perpendicular to the interfaces for small periodicity multilayers.

Additional information

Authors: TIXIER S, Laboratory for Neutron Scattering, ESI and PSI, Villigen (CH);BÖNI P, Laboratory for Neutron Scattering, ESI and PSI, Villigen (CH);MANNIX D, University of Liverpool (GB);STIRLING W, University of Liverpool (GB);LANDER G, EITU, Karlsruhe (DE)
Bibliographic Reference: Paper presented: 1st European Conference on Neutron Scattering ECNS '96, Interlaken (CH), October 8-11, 1996
Availability: Available from (1) as Paper EN 41216 ORA
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