The quasi-amorphous ESTI sensor
This paper describes an approach to define a stable reference device for the measurement and monitoring of a-Si modules. The device is based on a crystalline silicon cell identical in construction to an ESTI sensor with the addition of a broad band filter to match the spectral response of the device to that of a-Si. The calibration procedure is described generically and uncertainties regarding statistical evaluation are highlighted together with the spectral response of the device. Different calibration factors are obtained depending upon the reference device used. Device performance over an 18 month period is compared to that of a normal ESTI sensor.
Bibliographic Reference: Paper presented: Symposium Photovoltaische Solarenergie, Staffelstein (DE), March 11-13, 1998
Availability: Available from (1) as Paper DE 41256 ORA
Record Number: 199810468 / Last updated on: 1998-05-05
Original language: de
Available languages: de