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Abstract

The major problem affecting the application of chromium in high temperature processes is the ongoing spallation of the protective oxide layer formed during hot gas oxidation. This results in a continuous material erosion. To gain a deeper insight in the spallation and oxidation process a high purity powder metallurgically produced chromium sample was submitted to a two stage hot gas oxidation process. The formed oxide layers were investigated by 3-dimensional secondary ion mass spectrometry (SIMS) and scanning SIMS.

The forming of the protective oxide layer is carried out by the diffusion of chromium from the bulk through the already existing oxide layer and the reaction of the diffused chromium with the oxygen from the gaseous phase. In parallel to the growing of the oxide layer an accumulation of impurities at the interface oxide layer - bulk can be observed. The enrichment of trace elements at the interface level (for the investigated sample namely chloride and nitrogen) can be explained by the low solubility of these elements in chromium oxide and therefore their inability to diffuse through the already formed protective layer. .

Additional information

Authors: BRUNNER C H, Vienna University of Technology, Institute of Analytical Chemistry (AT);HUTTER H, Vienna University of Technology, Institute of Analytical Chemistry (AT);PIPLITS K, Vienna University of Technology, Institute of Analytical Chemistry (AT);GRASSERBAUER M, Vienna University of Technology, Institute of Analytical Chemistry (AT);WILHATITZ P, Metallwerke Plansee GmbH, Reutte (AT);STROOSNIJDER R, JRC Ispra (IT)
Bibliographic Reference: Article: Fresenius Journal of Analytical Chemistry (1998)
Record Number: 199810510 / Last updated on: 1998-05-05
Category: PUBLICATION
Original language: en
Available languages: en