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This report consists of the talks and posters held at the 132nd PTB seminar Solid state analysis. It deals with a range of modern and often complementary analysis techniques used to characterise solid states, like spark stimulus mass spectrometry (SSMS), glow discharge stimulus (GDMS) and inductively coupled plasma stimulus mass spectrometry (ICP-MS), gas mass spectrometry, prompt (n, gamma gamma) spectrometry, infra-red and Raman spectrometry. A comparison of analysis techniques is also carried out. Among the examined materials are microelectronic materials, like silicon, gallium arsenide and high temperature superconductors, as well as geological samples. In addition the term metrology, still fairly new in chemistry, is discussed.

Additional information

Authors: JÄHRLING R, Physikalisch- Technische Bundesanstalt, Braunschweig (DE);SCHIEL D (EDITORS), Physikalisch- Technische Bundesanstalt, Braunschweig (DE)
Bibliographic Reference: Report: PTB-ThEx-3 DE (1997) 167pp.
Availability: Available from Physikalisch Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig (DE)
ISBN: ISBN 3-89701-089-5
Record Number: 199811053 / Last updated on: 1998-10-09
Original language: de
Available languages: de
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