Magnetic properties of UPd(2)A1(3) thin films investigated by resonant magnetic x-ray scattering
Thin films with thicknesses varying from 100 angstroms to 1600 angstroms of the magnetic heavy-fermion superconductor UPd(2)Al(3) have been investigated by resonant magnetic x-ray scattering. All films studied show the same antiferromagnetic structure as the bulk material. The magnetic order seems to develop initially on the surface of the film and penetrates into the film on lowering the temperature. In the hexagonal c direction (film growth direction) the magnetic correlations extend over the complete film thickness at low temperature. The magnetic correlation lengths in the plane of the film are approximately equal to those along the c-axis.
Bibliographic Reference: Paper presented: International Conference on Strongly Correlated Electron Systems (SCES), Paris (FR), 15-18 July 1998
Availability: Available from (1) as Paper EN 41406 ORA
Record Number: 199811160 / Last updated on: 1998-10-09
Original language: en
Available languages: en