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Authors: KRAAN B, Delft University of Technology, Department of Statistics, Stochastics and Operations Research (NL);COOKE R, Delft University of Technology, Department of Statistics, Stochastics and Operations Research (NL)
Bibliographic Reference: Extract: Second international symposium on sensitivity analysis of model output, Venice, Italy, 19-22 April 1998: Proceedings (1998) pp. 163-165
Availability: Available from the Public Relations and Publications Unit, JRC Ispra, I-21020 Ispra (IT), Fax: +39-0332-785818
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