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Authors: RAHNI N, University of Paris, LETIEF, Créteil (FR);RAMDANI N, University of Paris, LETIEF, Créteil (FR);CANDAU Y, University of Paris, LETIEF, Créteil (FR);GUYON G, Electricité de France, Research Centre, Moret-sur-Loing (FR)
Bibliographic Reference: Extract: Second international symposium on sensitivity analysis of model output, Venice, Italy, 19-22 April 1998: Proceedings (1998) pp. 211-213
Availability: Available from the Public Relations and Publications Unit, JRC Ispra, I-21020 Ispra (IT), Fax: +39-0332-785818
Record Number: 199821023 / Last updated on: 1998-07-20
Category: PUBLICATION
Original language: en
Available languages: en