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Actinide samples were characterized in an interlaboratory comparison between IRMM and NIST, including alpha-particle counting at defined low solid-angle and counting in a 2pi proportional gas counter. For this comparison, nine 233UF(4) samples with high uniformity in the layer thickness were prepared at IRMM by deposition under vacuum. Polished silicon wafers were used as source substrates , and these were rotated during the deposition using a planetary rotation system.

The estimated uncertainties for the defined low solid-angle methods were about 0.1% at both NIST and IRMM. The agreement of reported alpha-particle emission rates in the energy range 2.5-5.09 MeV was better than or equal to 0.02% for the defined solid-angle methods. When comparing total alpha-particle emission rates over the larger energy range 0-9MeV (which includes all emissions from the daughter nuclides and iimpurities0, the agreement of the defined solid-angle methods was better than or equal to 0.05%.

The 2pi proportional gas counter results were about 0.75% higher than those of the defined solid-angle methods. A re-examination of the correction for scattering from the polished silicon wafer substrates was undertaken to explain this discrepancy. Preliminary results of the recalculated 2pi proportional gas counter results are also given. en.

Additional information

Authors: DENECKE B, IRMM Geel (BE);EYKENS R, IRMM Geel (BE);PAUWELS J, IRMM Geel (BE);ROBOUCH P, IRMM Geel (BE);GILLIAM D M, National Institute of Standards and Technology;HODGE P, National Institute of Standards and Technology;HUTCHINSON J R M, National Institute of Standards and Technology;NICO J S, National Institute of Standards and Technology
Bibliographic Reference: Article: Nuclear Instruments and Methods - A, 1998
Record Number: 199910702 / Last updated on: 1999-05-14
Original language: en
Available languages: en