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Abstract

The renewal of a series of BCR certified reference materials of unalloyed zinc, a production process has to be found which is yielding homogenous casting material also for an iron impurity in sample areas of 1mm diameter. In order to achieve the necessary precision in the determination of this low Fe content the PIXE analysis system had to be developed in three crucial components simultaneously:

optimizing the thickness of a Ni absorber foil in order to selectively reduce the counting rate of Zn without adding the unproportionally high Ni counting rate.

implementing a triggered ion beam deflection system capable of handling very high counting rates without distorting the PIXE spectrum in terms of peak shapes or excessive pile-up events.

developing the spectrum evaluation code to take account of the absorber foil and to cope with the background shape generated by these samples. ples.

Additional information

Authors: GAMEZ F, IRMM, JRC-Geel (BE);CHAVES C, IRMM, JRC-Geel (BE);WATJEN U, IRMM, JRC-Geel (BE)
Bibliographic Reference: Paper presented: 8th International Conference on Particle-Induced X-ray Emission and its analytical applications, Lund (CH), 14-18 June 1998
Availability: Available from Public Relations and Publications Unit, JRC-Ispra (IT)
Record Number: 199911096 / Last updated on: 1999-08-06
Category: PUBLICATION
Original language: en
Available languages: en
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