The Microstructure of a Yttria-Doped Hot-Pressed Silicon Nitride.
A thorough knowledge of a material's microstructure is an essential starting point from which material development and property characterization can be undertaken. This paper discusses the importance of combining different techniques, namely X-ray diffractometry, scanning electron microscopy and transmission electron microscopy for gaining a better understanding of the complex microstructure of commercially available Si3N4-based ceramics. Microstructural analyses of a commercial hot-pressed silicon nitride densified with the aid of 9.0 wt% Y2O3 and 1.7 wt% Fe2O3 revealed that this material consists primarily of prismatic hexagonal grains of ?-Si3N4 surrounded by a crystalline intergranular phase identified as Y10(SiO4)6N2 (also known as H-phase), the volume fraction of which was estimated to be about 15%. By means of electron diffraction pattern analysis in a conventional TEM some
Bibliographic Reference: Article: Ceramics International (1999)
Record Number: 199911392 / Last updated on: 1999-09-17
Original language: en
Available languages: en