Community Research and Development Information Service - CORDIS


A generally applicable method for quantitative depth profile analysis of conductive and non-conductive surface layers using radio frequency glow discharge optical emission spectrometry (RF GD-OES) has been developed. The method has been tested successfully for limited applications, and it has been implemented in a software package (GD_QUANT RF). Discusses objectives of the project, technical background, outlines the research program, the materials used, quantification and qualitative methodology.

Additional information

Authors: OSTERHOLM L, SSAB , Borlange (SE);HOMMAN P, SSAB , Borlange (SE);BENGTSSON A, Swedish Institute for Metal Research, Stockholm (SE);HANSTROM S, Swedish Institute for Metal Research, Stockholm (SE);HOCQUAUX H, IRSID (FR);MEILLAND R, IRSID (FR);ZACCHETTI N, CSM Rome (IT);PICCOLO E, CSM Rome (IT);HOFFMAN V, Institut fur Festkorper, Dresden (DE);PRASSLER F, Institut fur Festkorper, Dresden (DE)
Bibliographic Reference: EUR 18919 EN (1999), 83pp.
Availability: Available from OOPEC Sales agents
ISBN: ISBN 92-828-7289-0
Record Number: 199911513 / Last updated on: 1999-10-29
Original language: en
Available languages: en