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Abstract

Thin polycrystalline films of Pu were investigated by X-ray and ultra-violet photoelectron spectroscopies. The films were deposited on Polycrystalline AL, and the electronic structure as a function of overlayer thickness and overlayer-substrate interactions was studied. For decreasing Pu layer thickness, we found a pronounced tendency for 5f localization, and both core level and valence band spectra of monolayer Pu show more similarities with Am metal than with alpha-Pu metal.

Additional information

Authors: GOUDER T, ITU KARLSRUHE, KARLSRUHE (DE)
Bibliographic Reference: Paper presented: Journal of electron Spectroscopy and related Phenomena (1999)
Availability: Available from Public Relations and Publications Unit, Ispra (IT)
Record Number: 199911555 / Last updated on: 1999-11-06
Category: PUBLICATION
Original language: en
Available languages: en