Quantitative analysis of Deuterium in a -C:D Layers, a round robin experiment
The absolute amount of deuterium in amorphous deuterated carbon (a-C:D) layers has been measured by six laboratories with different techniques, such as MeV ion beam analysis, secondary ion mass spectrometry (SIMS), and thermal desorption spectrometry (TDS). The a-C:D layers have been deposited from a CD4 glow discharge plasma onto carbon and silicon substrates. The results for the absolute numbers obtained with the different analysing techniques show a scatter of up to about 35% around the average value. These deviations are larger than the errors stated by the experimentalists and indicate possible systematic uncertainties in some of the measurements.
Bibliographic Reference: Article: Journal of Nuclear Materials, vol. 281 (2000), pp. 42-56
Record Number: 200012934 / Last updated on: 2000-12-18
Original language: en
Available languages: en