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Abstract

Several different methods can be and have been applied for measuring the amounts and depth profiles of the hydrogen isotopes in the surface layers of solids, such as the vessel walls of fusion experiments. Mostly MeV ion beam analysis techniques are applied. In addition, low energy ion beam sputtering and detection of the sputtered positive or negative ions (SIMS and AMS), thermal desorption spectrometry as well as counting the T activity with an open detector are used. The detection limits for these measurements are best for SIMS, AMS and counting the T activity being of the order of 1E8 atoms per cm{2}, which has to be calibrated, while the MeV ion beam analysis giving directly quantitative numbers is about two to three orders of magnitude and TDS about 8 orders of magnitude less sensitive.

Additional information

Authors: BERISCH R, Max-Planck-Institut fur Plasmaphysik, Garching bei Munchen (DE)
Bibliographic Reference: An article published in: Physica Scripta, Vol.T94 (2001), pp.52-57
Record Number: 200114046 / Last updated on: 2001-11-15
Category: PUBLICATION
Original language: en
Available languages: en