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A software package developed for quantitative characterization of microstructures with particle-induced X-ray emission (PIXE) measurements is described. The system includes the following parts: a solution of the PIXE signal equation with respect to the beam profile function by the Fourier method and a reconstruction of the elemental concentration distribution from a measured signal by the method of successive substitutions. The results of applying the developed program to the experimental distribution maps obtained from a micro-structured reference material are compared with the known properties of this reference material.

Additional information

Authors: CHUKALINA M V, JRC, Institute for Reference Materials and Measurements, Geel (BE);WATJEN U, JRC, Institute for Reference Materials and Measurements, Geel (BE)
Bibliographic Reference: An oral report given at: The 7th International Conference on Nuclear Microprobe Technology and Applications, Bordeaux (FR), 10-15 September 2000 Published in: Nuclear Instruments and Methods in Physics Research B, Vol.181 (2001), pp.249-2
Record Number: 200114136 / Last updated on: 2001-12-21
Original language: en
Available languages: en