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Abstract

The structural and stoichiometric characterisations of silicon crystals are reported to find the origin of a molar volume discrepancy. The target of reproducing this anomaly was achieved and a hypothesis is proposed.

Additional information

Authors: ALASIA F ET AL, Istituto di Metrologia "Gustavo Colonetti", Torino (IT);BECKER P ET AL, Physikalisch-Technische Bundesanstalt, Braunschweig (DE);VALKIERS S, European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, Geel (BE);TAYLOR P, European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, Geel (BE);DE BIÈVRE P, European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, Geel (BE);JENSEN L, Topsil Semiconductor Materials A/S, Frederikssund (DK);SERVIDORI M, Istituto LAMEL - CNR, Bologna (IT);SPIRITO P, University of Naples Federico II, Naples (IT);ZENI L, University of Naples Federico II, Naples (IT);AMATO G, Istituto Elettrotecnico Nazionale "Galileo Ferraris", Torino (IT);RIEMANN H, Institut f¨r Kristallzüchtung, Berlin (DE);HAERTWIG J, European Synchrotron Radiation Facility, Grenoble (FR);VON AMMON W, WACKER Siltronic AG, Burghausen (DE)
Bibliographic Reference: An oral report given at: CPEM 2002: Conference on Precision Electromagnetic Measurements Organised by: National Research Council Canada Held at: Ottawa (CA), 16-21 June 2002
Record Number: 200214531 / Last updated on: 2002-04-03
Category: PUBLICATION
Original language: en
Available languages: en