Crystal structure characterisation of filtered arc deposited alumina coatings: temperature and bias voltage
Using a filtered vacuum arc deposition device, stoichiometric aluminum oxide (Al(2)O(3)) films, with thickness ranging from 20 nm to several microns, were produced under various substrate bias voltages and temperatures. Analysis of the resulting alumina crystal structures was performed with transmission electron microscopy, Fourier transform infrared spectroscopy and X-ray diffraction. Depending on the negative substrate bias voltage, the deposition temperature required to form alpha-Al(2)O(3) could be reduced. A crystal phase diagram showing the effect of bias and temperature is presented. Also, preliminary hydrogen permeation measurements of these coatings deposited on thin palladium foil show a good barrier performance as compared with uncoated samples.
Bibliographic Reference: An article published in: Surface and Coatings Technology, Volumes 174-175, pp. 606-610 (2003)
Availability: This article can be accessed online by subscribers, and can be ordered online by non-subscribers, at: http://dx.doi.org/doi:10.1016/S0257-8972(03)00539-5
Record Number: 200719173 / Last updated on: 2007-05-21
Original language: en
Available languages: en