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  • Nano-scale chemical mapping and surface structural modification by joined use of X-ray microbeams and tip assisted local detection (X-TIP) - Publishable Final Activity Report
FP6

Nano-scale chemical mapping and surface structural modification by joined use of X-ray microbeams and tip assisted local detection (X-TIP) - Publishable Final Activity Report

Project ID: 505634
Funded under: FP6-NMP

Abstract

The perspectives of nanotechnology in tailoring the physical-chemical characteristics of nanoobjects are linked to our knowledge and control of their shape. Any characterization technique has then to be linked with a morphological knowledge of the sample. In 2004, when the X-Tip project started, it was already possible in many facilities of the world to focus the beam on spots of about 100 nm but there was no possibility of in situ visualizing samples with that dimensions, making impossible the link between spectroscopic characteristics and size. The only way out was a cumbersome procedure of mapping via SEM or other ex-situ microscopies to be transferred to the X-ray microscope alignment system.
The objectives set for the X-Tip project were then quite wide: on one side we wanted to give an answer to the need of navigating over the surface under examination and provide the possibility of mechanical intervene to modify it (moving and aligning dots, applying pressure, and on the other side we wanted to explore all the possibilities to utilize the tip itself as a detector, in such a way to leave the definition of the lateral resolution of the measurement to the tip geometry and not to the spot dimensions.
The exploratory character of the project was linked to the emerging needs of nanocharacterization techniques and in phase with the development of Synchrotron Radiation instrumentation.

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Record Number: 9468 / Last updated on: 2008-10-30
Category: PROJ