Servicio de Información Comunitario sobre Investigación y Desarrollo - CORDIS

On line monitoring system for quality control using analysis of optical spectra

A monitor has been developed which analyzes on line simultaneous complex optical spectra originated by plasma or fluorescence which are either laser induced or of chemical origin. The monitor is useful in processor such as:
laser surface treatments eg welding, cutting, ablation, coating, etc;
etch processes of semiconductors;
non laser applications eg coating process of thin films.

This online monitor allows detection and control in situ. Tungsten inert gas (TIG) welding processes can be monitored on line to achieve documented quality control.


Peter STANITZECK, (General Manager)
Tel.: +49-8105-5011
Fax: +49-8105-5577
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