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FP5

PRO-ENBIS Résumé de rapport

Project ID: G6RT-CT-2001-05059
Financé au titre de: FP5-GROWTH
Pays: United Kingdom

A multi-scale approach to functional signature analysis

Nowadays, electronic products tend to be economically outdated before their technical end-of-life has been reached. The ability to analyse and predict the (remaining) technical life of a product would make it possible either to re-use sub-assemblies in the manufacture process of new products, or to design products for which the technical and economical life match. This requires models to predict and monitor performance degradation profiles. In this paper we report on designed experiments to obtain such models. We show how wavelet analysis can be used to extract features from electrical signals. These features are analysed using the Analysis of Variance in order to establish relations between these features and performance degradation.

Reported by

LONDON SCHOOL OF ECONOMICS AND POLITICAL SCIENCE
Houghton Street
WC2A 2AE LONDON
United Kingdom
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