Servicio de Información Comunitario sobre Investigación y Desarrollo - CORDIS


DEW Informe resumido

Project ID: IST-1999-29012
Financiado con arreglo a: FP5-IST
País: Germany

Cryogenic system for electrical characterization of DEW devices at high frequencies

Design, fabrication and testing of the measurement set-up for on-wafer HF characterization of electronic devices within 20K-300K temperature range, including a vacuum set-up with low-vibration interface and a computer-controlled positioning system for the co-planar HF probes.

Applicable immediately to any research projects about electronic device application, potentially of value over many years.

Electrical characterization of other electronic devices, like GaN-based HEMTs, surface channel FETs on diamond and diamond-based MEMS structures.


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