Community Research and Development Information Service - CORDIS


HITRAP Report Summary

Project ID: HPRI-CT-2001-50036
Country: Germany

Development of a reaction microscope and an apparatus for RIMS

A reaction microscope (combined multi-electron recoil ion momentum spectrometer) particularly suitable for charge- transfer collision experiments between highly charged ion (HCI) beams and atomic/molecular gas targets has been developed in Heidelberg. The additional detector required to analyse the charge-state of the projectile has been implemented. The extraction beam-line of the Heidelberg Electron Beam Ion Trap (EBIT) and the necessary beam diagnostics were constructed, assembled, commissioned and tested. Subsequently, the extraction from the trap and the associated beam optics were optimised.

The reaction microscope has been installed and successfully tested at the EBIT beam-line by performing electron capture experiments with extracted slow HCI. Data were taken for the following collision systems: (a) F7+, Ne10+, Ar16+ on He and (b) U64+ on He and Ne. Precision spectroscopy not only of light HCI but also, for the first time, of the heavy U64+ ions has been achieved in charge transfer experiments. It is therefore achievable to perform similar studies at HITRAP.

A Recoil Ion Momentum Spectrometer (RIMS) allowing multi-fragment coincident detection has been developed and successfully tested by carrying out ion-molecule collision experiments with HCI beams provided from the GANIL accelerator facility. The molecular fragmentation details have been revealed in great detail.

Then, coincident multi-electron detection has been implemented in the RIMS to transform it in a so called "reaction microscope". The successful operation and detection of the emitted electrons has been demonstrated in the following experiments performed at GANIL:
(i) Coincident Auger electron spectroscopy in slow ion-atom collisions
(ii) Electron emission following fast ion-D2 collision. Similar studies of fast ion-H2 collisions have been performed in Heidelberg using the same experimental technique.

Another RIMS apparatus, combining imaging and time-of-flight techniques, specifically suitable for ion-surface interaction studies has been developed. Sputtering of secondary ions from LiF and UO2 solid surfaces after HCI impact has been investigated at GANIL for two different impact velocity regimes: (i) for fast ions (10 MeV/u Ca17+) and (ii) for slow ions (17keV/q Xe21+), thus demonstrating the applicability for HITRAP.

We have successfully developed reaction microscopes and RIMS as multi-purpose instruments for studying charge-transfer processes between HCI and atoms/molecules/clusters/surfaces. All apparatus are operational and ready to be transferred to the HITRAP facility. In the mean time, they are standalone, integrated in the research program at GANIL or Heidelberg, respectively, and constitute ideal set-ups for short-time training projects as well.


Joachim ULLRICH, (Scientific director)
Tel.: +49-6221-516696
Fax: +49-6221-516604
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