Service Communautaire d'Information sur la Recherche et le Développement - CORDIS

FP5

FANTASI Résumé de rapport

Project ID: ENK6-CT-2001-00561
Financé au titre de: FP5-EESD
Pays: Italy

Double wavelength transverse probe lifetime measurement set-up

A contactless, all-optical and non-destructive technique for simultaneous measurement of minority carrier recombination lifetime and surface recombination velocity, at low injection level, in silicon samples is presented. Being contactless and non-destructive with respect to the surface to be analysed, the method is suitable for routine lifetime characterisation in solar cell process. The technique is applicable to the measurement of bulk recombination lifetime and surface recombination velocity on thin multi-crystalline Silicon samples

Contact

Andrea IRACE, (Associate Professor)
Tél.: +39-081-7683116
Fax: +39-081-5934448
E-mail