Servizio Comunitario di Informazione in materia di Ricerca e Sviluppo - CORDIS

FP5

FANTASI Sintesi della relazione

Project ID: ENK6-CT-2001-00561
Finanziato nell'ambito di: FP5-EESD
Paese: Italy

Double wavelength transverse probe lifetime measurement set-up

A contactless, all-optical and non-destructive technique for simultaneous measurement of minority carrier recombination lifetime and surface recombination velocity, at low injection level, in silicon samples is presented. Being contactless and non-destructive with respect to the surface to be analysed, the method is suitable for routine lifetime characterisation in solar cell process. The technique is applicable to the measurement of bulk recombination lifetime and surface recombination velocity on thin multi-crystalline Silicon samples

Reported by

University of Naples
Via Claudio, 21
80125 Naples
Italy
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