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Content archived on 2023-01-04

Photovoltaic Device and Systems Research, 1988-1991

Objective

To improve, develop and assess methods for performance and qualification testing of photovoltaic components and systems.

Progress to end 1990

Based on results from the "Thin-Film Qualification Task Force", the indoor degradation procedure for thin-film modules was implemented (Light Soaking Test). A 300h simulated light exposure is applied to batches of commercial amorphous silicon modules which are subsequently annealed for 50h at different temperatures. The test serves for reproduceable assessment of light-induced degradation effects on advanced photovoltaic materials.
Carrier lifetime determinations in the bulk and at the surfaces of commercial solar cells and of the related silicon wafers have shown that: 1) the technological cell manufacturing process does not degrade the raw material quality and, 2) the aluminium deposition on the rear of the cell reduces drastically the "effective" carrier surface recombination. Publication: R. Van Steenwinkel et al., Solar Cells, 28, 287 (990).
The prototype specification of the silicon radiation sensor for in-field monitoring purposes has been issued: the feasibility of the concept with regard to the temperature determination has been proved, temperature errors of less than 0.5 are achieved.
The measurements and modelling of solar spectra has been extended to low irradiance conditions (<200 Wm2) in order to provide criteria for the low-irradiance performance tests as proposed by the IEC. The spectroradiometer was improved with regard to its temperature stability and allows now precise and continuous measurement runs with wavelength resolutions better than 2mm.
Two new standards proposals have been issued: the Specifications 503 and 701 for the qualification of crystalline resp. amorphous thin-film modules. Both enter as proposals into the working group of CENELEC. The specification 701 serves as description of a trial phase, until final results can be presented which allow a definitive version.
A new Energy Rating facility has been set up. It allows to execute 4 out of 5 performance measurements as proposed by the IEC in a single experiment.
Field tests of Loser-PV plant executed (EUREKA project 333).
Further investigations on device measurement errors introduced by flash simulators showed that thin-film technology exhibits errors less than 1%; however, flash measurements on recent crystalline technologies can introduce errors as high 15%. A primitive model is proposed to explain the effect.

Detailed description of work foreseen in 1991 (expected results)
Measurement and modeling methods for the determination of efficiency limits of commercial solar cells (Final development of a numerical 1-dimensional cell modeling program which takes into account the effects of high and arbitrary doping profiles).
Contribution to European data bank on solar radiation spectra. (Extension to spectral energy data for multi-junction concept optimisation).
Assessment of system concepts for grid-connected residential applications. (Support to the 1000-roof program of Germany).
Advise and experimental support to standard organizations (IEC and CENELEC) for Thin-Film Measurements and Qualification Norms (Specification 701 as CENELEC standard).
Measurements on amorphous thin-films as European reference laboratory within the frame of SMART (Stable Material Advisory Research Team).

Short description of evolution of work in 1992

Development of measurement and test methods for reference and qualification purposes, to be implemented within European and world-wide standard bodies. Emphasis on codes for application in the building sector.

Topic(s)

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Call for proposal

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Funding Scheme

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Coordinator

Joint Research Centre (JRC)
EU contribution
No data
Address

21020 Ispra
Italy

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Total cost
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