Objective This proposal is aimed at developing a new method based on quantitative depth profile analysis by DC GD-OES, which permits rapid multi-element analysis of very thin films (passive films on stainless steels, conversion layers on plane and coated steel sheets,), with the following technical specifications: minimum information depth about 5nm; multi-element capability of 20 elements in one measurement; quantification of major and minor elements with an accuracy better than 10%; analysis time (measurement + quantification) of a few minutes for very thin layers. Programme(s) ECSC-STEELRES 8C - Medium-term guidelines (ECSC) for the programmes of technical steel research and of steel pilot/demonstration projects, 1991-1995 Topic(s) E - Analytical Techniques for Processes, Products & Environment Call for proposal Data not available Funding Scheme Data not available Coordinator INSTITUTET FÖR METALLFORSKNING, ANSLAGSSTIFTELSE EU contribution No data Address Drottning Kristinas väg 48 114 28 STOCKHOLM Sweden See on map Total cost No data
