Objetivo - To assess the mechanical scanning unit for high inspection rate, from single component to JEDEC tray size. - To assess the ultrasonic instrumentation and software (new DSP board for gate peak detection).- To evaluate the software for control and image generation/assessment.The scanning acoustic microscope (SAM) developed by Ultrasonic Sciences Ltd. will be assessed. The equipment, which uses high frequency imaging and characterisation techniques will be evaluated for its improved capability for non-destructive inspection and investigation of plastic encapsulated semiconductor components. Generation of multiple images from a single scan will enable several fault features at different levels (die attach chip delamination, plastic voids) in the package to be examined simultaneously. Measurement features will be easily changeable during the assessment by using fast reprogrammable FPGAs in the DSP200 boards. Ámbito científico natural sciencescomputer and information sciencessoftwarenatural sciencesphysical sciencesopticsmicroscopynatural sciencesphysical sciencesacousticsnatural sciencesphysical scienceselectromagnetism and electronicssemiconductivity Programa(s) FP4-ESPRIT 4 - Specific research and technological development programme in the field of information technologies, 1994-1998 Tema(s) 2.9 - Building blocks, methods & tools for semiconductor app&techs Convocatoria de propuestas Data not available Régimen de financiación ACM - Preparatory, accompanying and support measures Coordinador Alcatel Microelectronics N.V. Aportación de la UE Sin datos Dirección Westerring 15 9700 Oudenaarde Bélgica Ver en el mapa Coste total Sin datos
