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Contenido archivado el 2022-12-23

Advanced X-ray techniques for materials study based on the new generation of focusing devices

Objetivo

Nowadays due to development of submicron technology, it has become possible to produce a new type of X-ray optical elements, which combine Bragg diffraction on a crystal and Fresnel focusing. Such elements have been used in beamlines at a number of synchrotron sources, where the European Synchrotron Radiation Facility (ESRF, Grenoble, France) is leading. The experience of their applications has brought to some limitations of this kind of X-ray optics and has shown the need for the future development using compound refractive lenses.

The proposed project is devoted to the development of high resolution X-ray methods namely phase-contrast imaging and local diffraction diagnostics based on a new generation of X-ray focusing elements. It is planned to solve following problems: to develop new types of devices based on principles of Bragg- Fresnel diffraction and optics of refraction on compound and kinoform profiles; to create the optimised set of devices with the desired properties using modern technologies such as electron and X-ray lithography, deep plasma-chemical etching, precise mechanical forming.

Concerning phase-contrast imaging for low-absorbing materials first of all theoretical and experimental investigation of basic principles of internal structure reconstruction especially with the use of high resolution focusing optics, including the X-ray interferometric tomography will be done. Creation of experimental optical systems operating in promising and important energies range up to 100keV in the third generation accelerators and low- power laboratory sources will be furnished in this part of project.

Local diffraction diagnostics implies the development of experimental schemes on the base of the created focusing optics for investigation of bulky materials, surface layers and films and the creation of the principally new techniques with its approbation on some perspective types of objects.

Organisations, which are a part of this application, represent all the necessary activities needed for the successful work on the project. NIS countries are represented by the Yerevan State University, Armenia (group of Professor Trouni), Institute of Microelectronics Technology of the Russian Academy of Sciences, Chernogolovka, Russia (group of Dr Shulakov), and Budker Institute of Nuclear Physics, Novosibirsk, Russia (group of Professor N.Vinokurov). INTAS countries are represented by ESRF (group of A.Snigirev) and Institute of Physical Science of the University of Ancona, Italy (group headed by Professor F. Rustichelli). All listed participants posses full experimental experience and theoretical knowledge, have the necessary equipment and technical resources to make scientific program feasible. Professor F.Rustichelli is responsible for general coordination of all included teams as well as search of perspective applications fields of developed focusing devices and X-ray techniques.
The most meaningful expected results are creation of the optimised set of X-ray focusing elements fabricated by the advanced technologies and the development of the experimental set-ups of the microdiffraction and phase-contrast techniques adapted especially for laboratory and synchrotron radiation sources. Also the adequate mathematical models describing properties of the new type focusing elements on the base of the X-ray diffraction theory and software for the numerical simulation of these elements and optical schemes on their basis will be included. Developed advanced X-ray techniques based on focusing devices with enhanced properties open ways to a number of new applications in medicine, biology and material science.

Convocatoria de propuestas

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Régimen de financiación

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Coordinador

University of Ancona
Aportación de la UE
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Dirección
Via Ranieri, 65
60131 Ancona
Italia

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Coste total
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Participantes (4)